David Lewis

From Promise to Product: Enabling microLED Commercialization via High-Throughput EL Inspection

Commercializing microLED displays means overcoming technical and economic hurdles—chief among them, lagging yields. Although chip design and mass transfer are contributing factors, a major cause for low yields is the lack of effective testing and inspection equipment for microLED wafers. High-throughput electroluminescent (EL) inspection has emerged as a differentiating strategic advantage, which can unlock the promise of microLED display technology. This presentation will review the unique challenges of microLED inspection and how testing innovation leads to scalable manufacturing – accelerating time-to-market for AR applications, automotive displays, premium TVs, and more.

David Lewis is Founder and CEO of InZiv. An expert in microLED metrology and inspection, nano-technology, and nano-optical tools, David has also managed complex sales to world-leading companies and institutions. He holds multiple patents and has published multiple peer-reviewed papers in the field of nano-optics and nano-technology. David received his MSc. in Physical Chemistry from The Hebrew University of Jerusalem.